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屈折率

2016-12-08 14:20:09 | 英語特許散策

WO2012177673
"9. The method of claim 1, further comprising:

depositing a second ink from an inkjet printhead to the first organic buffer layer, the second ink being defined by a second carrier and dissolved or suspended film-forming organic material; and

driving off(除去)the second carrier to form an organic material layer on the first organic buffer layer;

wherein the first reflective electrode is semi-transparent and the first organic buffer layer exhibits a refractive index that is intermediate between a refractive index(屈折率)of the substrate and a refractive index of the organic material layer."

WO2012138659
"Referring to Figure 2 A, a dielectric stack mirror 100, which can be incorporated into(組み込む)an apparatus according to embodiments of the subject invention(対象発明、本発明), can include alternating layers of dielectric material (37. 39 ) having different indexes of refraction(屈折率)(n). For example, the higher n material 37 can be Ta2O5, and the lower n material 39 can be SiO2, though embodiments are not limited thereto(限定されない). Each layer (37. 39) can have a thickness of from about 10 nm to about 100 nm(から~の範囲の厚さ). and there can be from 1 to 40 (in quantity) of each type of layer."

US7268485
"The present invention recognizes the problem and also recognizes that the emission from a microcavity OLED device is highly angle dependent. The resonance condition of a microcavity OLED device can be described by Eq. 1:
2Σn i L i cos θi+(Q m1 +Q m2)λ/2π=mλ  Eq. 1
wherein:

  • ni is the refractive index(屈折率)and Li is the thickness of the ith sublayer in organic EL element;
  • θi is the angle of the light in the ith(i番目の;*i-thとしてない)sublayer measured from the normal to(対する法線)the plane of the OLED device;
  • Qm1 and Qm2 are the phase shifts in radians at the two organic EL element-metal electrode interfaces(境界面での;*at), respectively;
  • λ is the resonant wavelength to be emitted from the device; and
  • m is a non-negative integer.
    Note that the θi for the different sublayers (and including the angle of the light emitted outside of the device) are not independent but are related to each other via Snell's Law: ni sin θi=nj sin θj."
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